Commit Graph

2 Commits

Author SHA1 Message Date
NeilBrown
303a263544 ddf-sudden-degraded test fix.
Change how sudden-degraded devices should appear.
We don't record failure, we record that the device isn't there.

Signed-off-by: NeilBrown <neilb@suse.de>
2014-03-26 14:30:21 +11:00
NeilBrown
fdcd157a80 tests: add test that DDF marks missing devices as failed on assembly.
If we assemble a newly-degraded array, the missing devices must be marked
as 'failed' so we don't expect them in future.

Signed-off-by: NeilBrown <neilb@suse.de>
2014-03-11 17:11:08 +11:00